The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Sep. 30, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tomonori Hanaya, Tokyo, JP;

Yujiro Akuta, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01T 7/08 (2006.01); B01L 9/06 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); B01L 9/06 (2013.01); G01T 7/08 (2013.01); G01N 2035/041 (2013.01); G01N 2035/0412 (2013.01);
Abstract

An adapter is attached to each sample storage unit in a rack. Each adapter includes a pair of arms, and these arms include a pair of lower-end structural bodies. An opening force being imparted to a pair of the lower-end structural bodies in the horizontal direction when a sample container is mounted on the pair of lower-end structural bodies causes the bodies to retreat towards the outside in the horizontal direction. In the subsequent opened state, the sample container is passed from the rack to a lifting mechanism. In the closed state, pressure being applied to the sample container in the vertical direction causes a stopper segment, which is contained in each attachment, to be lowered. In this lowered state, the opening motion of the pair of arms is restricted.


Find Patent Forward Citations

Hanaya, Tomonori. (2018). Sample measuring device (U.S. Patent No. 9903881). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9903881

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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