The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Sep. 30, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Tomonori Hanaya, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 7/08 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01T 7/08 (2013.01); G01N 35/04 (2013.01); G01N 2035/041 (2013.01); G01N 2035/0415 (2013.01); G01N 2201/0646 (2013.01);
Abstract

In this sample measuring device a lifting mechanism conveys a sample container from a rack to a sample measuring chamber. An inside light-shielding structure is extended over the upper surface of a base frame and the lower surface of a head, and surrounds a shaft. The inside light-shielding structure is configured from a first ring groove and a first ring protrusion. When the head is in a ground state, the upper surface of the base frame and the lower surface of the head are contacted by the action of a spring. At this time, the first ring groove and the first ring protrusion are integrated. An outside light-shielding structure is provided to the periphery of the inside light-shielding structure. A top plate contains a laminate structure which includes a lightshielding sheet and a lightreflecting plate.


Find Patent Forward Citations

Hanaya, Tomonori. (2017). Sample measuring device (U.S. Patent No. 9791577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9791577

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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