Hitachinaka, Japan

Tomoko Tomiyama

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomoko Tomiyama. Retrieved from https://idiyas.com/inventor/tomoko-tomiyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Tomoko Tomiyama and Her Automatic Analyzer Patent.

Introduction

Tomoko Tomiyama is an inventor associated with Hitachi-High-Technologies Corporation. Based in Hitachinaka, Japan, she is credited with 1 patent.

Latest Patents

Tomiyama’s patent, “Automatic Analyzer,” describes a system that stores operation information, including usage histories of expendable supplies used in analysis. An analysis-ID control unit assigns an identifier to each analysis, helping identify analyses used to derive calibration curves.

The system organizes stored data along a shared time axis, arranging it by both sample sequence and analysis item. This allows the information to be displayed in a unified data area and viewed in the context of each sample’s analysis process. The patent also describes using stored information about the potential impact of different abnormal conditions to determine whether reinspection is necessary.

Career Highlights

Tomiyama’s listed invention addresses data organization and inspection decisions in automated analysis. Her work is associated with Hitachi-High-Technologies Corporation.

Collaborations

Yoshimitsu Takagi and Kyoko Imai are identified as Tomiyama’s coworkers.

Conclusion

Tomoko Tomiyama’s “Automatic Analyzer” patent focuses on organizing analysis data and supporting decisions about when samples may require reinspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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