The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Feb. 11, 2009
Noriko Iizumi, Hitachinaka, JP;
Tomoko Tomiyama, Hitachinaka, JP;
Yoshimitsu Takagi, Hitachinaka, JP;
Kyoko Imai, Hitachinaka, JP;
Ryuichiro Kodama, Hitachinaka, JP;
Tomonori Mimura, Kasama, JP;
Noriko Iizumi, Hitachinaka, JP;
Tomoko Tomiyama, Hitachinaka, JP;
Yoshimitsu Takagi, Hitachinaka, JP;
Kyoko Imai, Hitachinaka, JP;
Ryuichiro Kodama, Hitachinaka, JP;
Tomonori Mimura, Kasama, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
An automatic analyzer includes a storage unit for storing operation information information about usage histories of expendable supplies provided for the analysis, and an analysis-ID control unit giving an ID to the analysis, the analysis ID being used as information for identifying the analysis to derive a calibration curve. Data stored in the storage unit is organized along the same time axis both in the order of samples subjected to the analysis and inspection, and in the order of analysis items, so that the data is output in a total data display area. The data is organized from the viewpoint of an analysis process of an analysis item of each sample. By use of information used to identify an influence range based on a kind of an abnormal state, which is stored beforehand, a judgment is made as to whether or not it is necessary to perform reinspection.