Tomohiro Mihira

Tomohiro Mihira is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of specimen processing technology, holding a total of 4 patents. His innovative work has advanced the capabilities of various apparatuses used in specimen analysis.

Latest Patents

Mihira's latest patents include a "Specimen Processing Holder and Specimen Processing Method." This invention features a holder that consists of a first sub holder for a primary specimen and a second sub holder for a support member. The primary specimen undergoes processing in a first state within a specimen processing apparatus. In a subsequent second state, a secondary specimen is prepared from the primary specimen, which is then moved onto the support member to create a thin film specimen.

Another notable patent is the "Charged Particle Beam Apparatus and Image Adjustment Method." This apparatus scans a specimen with a charged particle beam to acquire images. It includes a contrast adjustment circuit and a brightness adjustment circuit, both controlled by a unit that adjusts the image based on luminance information from a reference image. This innovation enhances the quality of images obtained during specimen analysis.

Career Highlights

Tomohiro Mihira is currently employed at Jeol Ltd., a company known for its advanced scientific instruments and technology. His work at Jeol Ltd. has allowed him to focus on developing cutting-edge solutions for specimen processing and imaging.

Collaborations

Mihira has collaborated with notable colleagues, including Mitsuo Suga and Yoshikazu Sasaki. These partnerships have contributed to the successful development of his innovative technologies.

Conclusion

Tomohiro Mihira's contributions to specimen processing technology through his patents and work at Jeol Ltd. highlight his role as a key innovator in the field. His inventions continue to influence advancements in specimen analysis and imaging techniques.