This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Tomoaki Yamazaki: Innovator in Pattern Measurement Technology
Introduction
Tomoaki Yamazaki is a distinguished inventor based in Tokyo, Japan. He has made significant contributions to the field of pattern measurement technology. His innovative work focuses on enhancing the accuracy and stability of measurements in complex patterns.
Latest Patents
Yamazaki holds a patent for a pattern measurement device and a computer program. This invention is designed to accurately and stably perform measurements based on edge identification or pattern judgment, regardless of the fineness or deviation of the pattern. The device classifies pattern sites that are repeatedly arrayed at specific intervals and executes various identification and measurement processes based on the classified pattern sites.
Career Highlights
Tomoaki Yamazaki is currently associated with Hitachi High-Technologies Corporation, where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the capabilities of measurement devices in various applications.
Collaborations
Yamazaki collaborates with Hitoshi Namai, a fellow innovator, to further enhance their research and development efforts in the field of pattern measurement.
Conclusion
Tomoaki Yamazaki's contributions to pattern measurement technology exemplify his commitment to innovation and excellence. His work not only advances the field but also sets a benchmark for future developments in measurement devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile