Hachioji, Japan

Tomoaki Tamura


Average Co-Inventor Count = 2.1

ph-index = 7

Forward Citations = 312(Granted Patents)


Location History:

  • Ome, JP (2012)
  • Hachioji, JP (1992 - 2015)
  • Tokyo, JP (1996 - 2018)
  • Kawasaki, JP (2018)

Company Filing History:


Years Active: 1992-2018

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13 patents (USPTO):Explore Patents

Title: The Innovations of Tomoaki Tamura

Introduction

Tomoaki Tamura is a prominent inventor based in Hachioji, Japan. He has made significant contributions to the field of semiconductor device manufacturing, holding a total of 13 patents. His work focuses on improving the efficiency and effectiveness of semiconductor production processes.

Latest Patents

Among his latest patents is a manufacturing method and program for semiconductor devices. This method involves forming multiple semiconductor chips on a semiconductor wafer, conducting electrical tests on each chip, and then dicing the wafer into individual chips. The process includes assembling these chips into packages, subjecting them to burn-in tests, and determining the necessity of these tests based on measurement data obtained during the probe test process. Another notable patent addresses the omission of burn-in tests for certain lots, streamlining the assembly process by sorting packages based on the necessity of the burn-in test.

Career Highlights

Tomoaki Tamura has worked with notable companies such as Konica Corporation and Konica Minolta Photo Imaging, Inc. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Throughout his career, Tamura has collaborated with talented individuals, including Hideaki Haraga and Yoshiyuki Nakamura. These partnerships have fostered a creative environment that has led to advancements in semiconductor manufacturing techniques.

Conclusion

Tomoaki Tamura's contributions to semiconductor device manufacturing highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving production processes and ensuring the reliability of semiconductor devices.

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