Tom T Ho

Title: Tom T Ho: Innovator in Integrated Circuit Defect Analysis

Introduction

Tom T Ho is a notable inventor based in San Carlos, CA (US). He has made significant contributions to the field of integrated circuit defect analysis, holding a total of 3 patents. His work focuses on innovative methods for analyzing defects in memory cells and integrated circuits.

Latest Patents

One of Tom's latest patents is titled "Bitmap cluster analysis of defects in integrated circuits." This patent discloses a system and method for defect analysis, where a defect data set is input into the system. A user selects a radius value, which determines the maximum number of bits that bit failures can be separated from one another to be considered a bit cluster. The system searches for neighboring fail bits and qualifies them based on the specified radius. If a minimum count of fail bits is met, the search continues until the maximum fail bit count specified by the user is reached. The system also provides aggregation to count the number of clusters that match or partially match each other.

Another significant patent is "Analysis techniques for multi-level memory." This system and method analyze defect data sets of multi-level memory cell devices and embedded multi-level memory in system-on-chip integrated circuits. An automated test engineering system analyzes the defect data set to generate fail bit locations and states. The system classifies failed bits or patterns, including vertical and lateral fail patterns, with various attributes such as fail type and sequence of fail states.

Career Highlights

Tom T Ho has worked with reputable companies in the industry, including Rudolph Technologies, Inc. and MKS Instruments, Inc. His experience in these organizations has contributed to his expertise in defect analysis and integrated circuit technologies.

Collaborations

Throughout his career, Tom has collaborated with notable professionals, including Jonathan B Buckheit and Weidong Wang. These collaborations have further enhanced his work in the field of integrated circuit defect analysis.

Conclusion

Tom T Ho is a distinguished inventor whose innovative patents have advanced the understanding and analysis of defects in integrated circuits and multi-level memory systems. His contributions continue to impact the field significantly.