Hillsboro, OR, United States of America

Tom Bramblett

This inventor holds 2 USPTO granted patents. Top assignees: Intel Corporation, Lam Research Corporation, Ontrak Systems, Inc.. Active years: 1999-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tom Bramblett. Retrieved from https://idiyas.com/inventor/tom-bramblett

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 2

Forward Citations = 58(Granted Patents)


Company Filing History:


Years Active: 1999-2002

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2 patents (USPTO):Explore Patents

Title: Tom Bramblett: Innovator in Substrate Cleaning Technologies

Introduction

Tom Bramblett is an accomplished inventor based in Hillsboro, OR (US). He holds 2 patents that focus on innovative cleaning mechanisms for substrates. His work has significantly contributed to the field of semiconductor manufacturing.

Latest Patents

Bramblett's latest patents include an "Apparatus for cleaning edges of contaminated substrates" and a "Method and apparatus for cleaning edges of contaminated substrates." Both inventions describe a cleaning mechanism that effectively removes particles from the edges of wafers using friction and differences in tangential velocity at the point of contact.

Career Highlights

Throughout his career, Tom Bramblett has worked with notable companies such as Lam Research Corporation and Ontrak Systems, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas in substrate cleaning technologies.

Collaborations

Some of his coworkers include Mansour Moinpour and Mohsen Salek. Their collaboration has likely contributed to the advancements in the technologies that Bramblett has developed.

Conclusion

Tom Bramblett's contributions to substrate cleaning technologies through his patents and career experiences highlight his role as an influential inventor in the semiconductor industry. His innovative approaches continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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