Todd M Petit

Title: Todd M Petit: Innovating Optical Metrology

Introduction

Todd M Petit is an accomplished inventor based in Livermore, California. With a focus on innovations in optical metrology, Petit has made significant contributions to his field. He holds one patent that showcases his ingenuity and technical expertise.

Latest Patents

Todd M Petit's notable patent is titled "Optical Metrology with Purged Reference Chip." This innovative patent describes an integrated metrology module that includes a chuck for holding and positioning a sample with respect to an optical metrology device. The patent features a reference chip that can move to various positions in relation to the optical metrology device, enhancing measurement accuracy. Additionally, the design incorporates a purge device that ensures a continuous flow of purge gas or air over the reference chip during its various positions, contributing to improved performance.

Career Highlights

Todd M Petit is currently affiliated with Nanometrics Inc., a company known for its advanced metrology systems and innovative solutions. His work at Nanometrics highlights his dedication to advancing technologies that benefit the semiconductor and materials industries.

Collaborations

During his career, Petit has collaborated with notable colleagues, including Andrew Saul Klassen and Andrew J Hazelton. These collaborations emphasize the importance of teamwork and shared knowledge in driving forward technological advancements.

Conclusion

Todd M Petit exemplifies the spirit of innovation in the field of optical metrology. His patented work on the purged reference chip demonstrates his commitment to enhancing measurement technologies. Through his position at Nanometrics Inc. and his collaborative efforts, Petit continues to contribute to cutting-edge advancements that hold promise for various applications in the industry.