This inventor holds 1 USPTO granted patent. Top assignee: John Fluke Mfg. Co., Inc.. Active years: 1989.
Company Filing History:
Years Active: 1989
Title: The Innovative Contributions of Tod K Johnson
Introduction
Tod K Johnson is a notable inventor based in Seattle, WA. He has made significant contributions to the field of measurement technology. His innovative approach has led to the development of a unique measuring device that enhances user experience and functionality.
Latest Patents
Tod K Johnson holds a patent for a "Measurement apparatus with plural displays of measured parameter." This measuring device includes a microprocessor controller programmed to perform various mathematical functions on a measured value of a parameter under test. The device features two displays that show both the parameter value and its mathematical function. Annunciators are included to identify the displayed function of the parameter. This allows users to view not only the measured parameter value but also offset, scaling, peak-to-peak values, and the uncertainty of a reading. Additionally, statistical functions such as average, standard deviation, median, or mode of the parameter under test can be displayed. The mathematical function display is updated concurrently with the measured parameter value, providing a comprehensive overview of the measurement.
Career Highlights
Tod K Johnson is associated with John Fluke Mfg. Co., Inc., where he has contributed to the advancement of measurement technology. His work has been instrumental in developing devices that improve accuracy and usability in various applications.
Collaborations
Throughout his career, Tod has collaborated with talented individuals such as Warren H Wong and Kenneth A Coulson. These collaborations have fostered innovation and enhanced the development of measurement technologies.
Conclusion
Tod K Johnson's contributions to measurement technology exemplify the spirit of innovation. His patented device showcases the importance of user-friendly design and functionality in modern measuring instruments. His work continues to influence the field and inspire future advancements.
