John Fluke Mfg. Co., Inc.

Tod K Johnson

Warren H Wong

Kenneth A Coulson

A measuring device includes a microprocessor controller programmed for performing any of a plurality of mathematical functions on a measured value of a parameter under test. The measuring device is provided with two displays, for displaying to a user both the parameter value and its mathematical function. Annunciators are provided to identify the displayed function of the parameter. Thus, together with the measured parameter value, offset, scaling, peak-to-peak values, or the uncertainty of a reading may be displayed, as well as statistical functions of the measurement, including an average, standard deviation, median or mode of the parameter under test. The methematical function display is updated concurrently with the display of the measured parameter value.

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Seattle, WA, United States of America

Tod K Johnson