The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1989
Filed:
Aug. 20, 1986
Kenneth A Coulson, Edmonds, WA (US);
Warren H Wong, Seattle, WA (US);
Tod K Johnson, Seattle, WA (US);
John Fluke Mfg. Co., Inc., Everett, WA (US);
Abstract
A measuring device includes a microprocessor controller programmed for performing any of a plurality of mathematical functions on a measured value of a parameter under test. The measuring device is provided with two displays, for displaying to a user both the parameter value and its mathematical function. Annunciators are provided to identify the displayed function of the parameter. Thus, together with the measured parameter value, offset, scaling, peak-to-peak values, or the uncertainty of a reading may be displayed, as well as statistical functions of the measurement, including an average, standard deviation, median or mode of the parameter under test. The methematical function display is updated concurrently with the display of the measured parameter value.