Williston, VT, United States of America

Timothy J Vonreyn


Average Co-Inventor Count = 2.1

ph-index = 2

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2003-2015

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3 patents (USPTO):Explore Patents

Title: Innovating Memory Technologies: The Contributions of Timothy J Vonreyn

Introduction: Timothy J Vonreyn, an accomplished inventor based in Williston, VT, has made significant contributions to the field of integrated circuits and memory testing. With a total of three patents to his name, he continues to push the boundaries of technology in his role at the International Business Machines Corporation (IBM).

Latest Patents: Among his latest innovations, Vonreyn has developed an address windowing method for at-speed bitmapping with built-in self-test (BIST) logic for memory arrays. This crucial method involves setting an address window to identify defects within a memory array. By comparing the output data to expected values, the method enables the identification of defects and stores relevant information in registers. Additionally, he has introduced a method and circuit for dynamic read margin control in self-timed memory arrays, optimizing read times based on operational frequencies.

Career Highlights: Working at IBM, Timothy J Vonreyn has dedicated his career to advancing memory technology. His inventions have led to improved testing methodologies and memory efficiency, showcasing his expertise and inventive spirit in the technology sector.

Collaborations: Vonreyn collaborates with notable colleagues, including Miles G Canada and Stephen Frank Geissler. These partnerships foster an environment of innovation, leading to the development of groundbreaking technologies and methodologies in the memory sector.

Conclusion: Timothy J Vonreyn's work at IBM exemplifies the intersection of engineering and invention, particularly in improving memory technology. His patents reflect a commitment to innovation and engineering excellence, marking him as a prominent figure in the world of integrated circuits and memory array testing.

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