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Fremont, CA, United States of America

Tim S Wihl

USPTO Granted Patents = 3

Average Co-Inventor Count = 2.8

ph-index = 2

Forward Citations = 98(Granted Patents)

Company Filing History:

Kla-tencor Technologies Corporation

Kla Tencor Corporation

Years Active: 2005-2014

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3 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8629902 - Coordinate fusion and thickness calibration for semiconductor wafer edge inspection (2014-01-14),

2. 7126699 - Systems and methods for multi-dimensional metrology and/or inspection of a specimen (2006-10-24),

3. 6917421 - Systems and methods for multi-dimensional inspection and/or metrology of a specimen (2005-07-12),

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