Milpitas, CA, United States of America

Tianhan Wang


Average Co-Inventor Count = 14.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2022-2023

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2 patents (USPTO):

Title: Innovations by Inventor Tianhan Wang in Milpitas, CA

Introduction

Tianhan Wang is a notable inventor based in Milpitas, California. He has made significant contributions to the field of spectroscopic metrology, holding a total of two patents. His innovative work is largely associated with his role at Kla Corporation, where he collaborates with other talented individuals in the industry.

Latest Patents

Tianhan Wang's latest patent focuses on "Bandgap measurements of patterned film stacks using spectroscopic metrology." This patent describes a sophisticated spectroscopic metrology system that includes a spectroscopic metrology tool and a controller. The controller generates a model of a multilayer grating that features geometric and dispersion parameters. It receives a spectroscopic signal from a fabricated multilayer grating and determines the values of the model parameters to provide simulated spectroscopic signals within a defined tolerance. Ultimately, the controller predicts the bandgap of the test layer based on the determined parameter values, enhancing the application's precision and reliability.

Career Highlights

Tianhan Wang has made substantial strides in his career, particularly through his work at Kla Corporation. His innovative ideas and practical applications have added value to the company's technological advancements. With two patents to his name, he demonstrates a commitment to pushing the boundaries of what is possible in spectroscopic measurement technology.

Collaborations

In his professional journey, Tianhan Wang collaborates closely with colleagues such as Aaron J. Rosenberg and Dawei Hu. These partnerships leverage collective expertise, driving innovation and shared success at Kla Corporation. The synergy among this team contributes significantly to their groundbreaking efforts in research and development.

Conclusion

Tianhan Wang is a distinguished inventor whose work in spectroscopic metrology continues to make waves in the technology sector. His latest patent, along with his collaboration with other experts, exemplifies the spirit of innovation and the pursuit of excellence at Kla Corporation. As he continues to push boundaries, Wang’s contributions will likely lead to further advancements in the field of spectroscopic measurement.

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