This inventor holds 2 USPTO granted patents. Top assignee: Agilent Technologies, Inc.. Active years: 2006-2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006-2008
Title: Tiam Hock Tan: Innovator in Automated Testing Solutions
Introduction
Tiam Hock Tan is a notable inventor based in Singapore, recognized for his contributions to the field of automated testing solutions. With a focus on enhancing the efficiency and effectiveness of in-circuit tests, he has developed innovative methods that streamline debugging and optimization processes. His work has significant implications for the electronics industry, particularly in the testing of integrated circuits.
Latest Patents
Tiam Hock Tan holds 2 patents that showcase his expertise in automated testing. His latest patents include:
1. **Method and apparatus for automated debug and optimization of in-circuit tests** - This invention presents a method and apparatus for automatically debugging and optimizing an in-circuit test used to evaluate a device under test on an automated tester. The technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid, stable, and preferably optimized test for execution on an integrated circuit tester.
2. **Method and apparatus for configuration of automated debug of in-circuit tests** - This patent details a method for configuring an automated in-circuit test debugger. The configuration technique incorporates expert knowledge into a knowledge framework for use by an automated test debug and optimization system. This system automates the formulation of a valid, stable in-circuit test for execution on an integrated circuit tester, utilizing a rule-based controller to manage interactions between the test-head controller and the automated debug system.
Career Highlights
Tiam Hock Tan is currently employed at Agilent Technologies, Inc., where he continues to innovate in the field of automated testing. His work has contributed to advancements in testing methodologies that enhance the reliability of electronic devices.
Collaborations
Throughout his career, Tiam has collaborated with notable colleagues, including Roy H. Williams and Aik Koon Loh. These collaborations have fostered a creative environment that encourages the development of cutting-edge testing solutions.
Conclusion
Tiam Hock Tan's contributions to automated testing represent a significant advancement in the field of electronics. His innovative patents and collaborative efforts continue to influence the industry, paving the way for more efficient testing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile