San Jose, CA, United States of America

Thuy Q Do

This inventor holds 1 USPTO granted patent. Top assignee: Mentor Graphics Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thuy Q Do. Retrieved from https://idiyas.com/inventor/thuy-q-do

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2013

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Thuy Q Do: Innovator in Model Calibration Techniques

Introduction

Thuy Q Do is a prominent inventor based in San Jose, CA (US). She has made significant contributions to the field of model calibration, particularly through her innovative patent that addresses contour alignment for model calibration.

Latest Patents

Thuy Q Do holds a patent titled "Contour alignment for model calibration." This invention discloses techniques for aligning measurement contours of printed layout features with simulation contours obtained from a model. The patent outlines methods for determining contour point errors and utilizing these errors, along with a cost function, to establish values for alignment parameters. These parameters are crucial for realigning measurement contours, which can be conducted concurrently with model calibration.

Career Highlights

Thuy Q Do is associated with Mentor Graphics Corporation, where she applies her expertise in model calibration. Her work has been instrumental in advancing techniques that enhance the accuracy of printed layout features.

Collaborations

Thuy has collaborated with notable coworkers, including Ir Kusnadi and Yuri Granik, contributing to a dynamic work environment that fosters innovation.

Conclusion

Thuy Q Do's contributions to model calibration through her patent demonstrate her commitment to advancing technology in her field. Her work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…