Thompson W Crosby

Title: Innovations by Thompson W Crosby

Introduction

Thompson W Crosby is a notable inventor based in San Jose, CA. He has made significant contributions to the field of semiconductor memory testing, holding a total of 4 patents. His work focuses on enhancing the efficiency and reliability of memory systems.

Latest Patents

One of his latest patents is for a testing implementation suitable for built-in self-repair (BISR) memories. This invention provides a memory testing circuit configuration that includes an output register for receiving digital data. A plurality of shift registers serially outputs the digital data to be received by the output register. Each shift register features a feedback path that allows the digital data output to be input back into the corresponding shift register in the same sequence as it is output.

Another significant patent involves parallel testing of a multiport memory. This invention discloses a multiport built-in self-test (BIST) method and apparatus. The method adapts a single port BIST by dividing the memory into sections based on the number of ports and applying the single port BIST simultaneously through all ports. This approach allows for efficient testing of memory sections in parallel, enhancing the overall testing process.

Career Highlights

Thompson W Crosby has worked at LSI Logic Corporation, where he has contributed to various innovative projects in semiconductor technology. His expertise in memory testing has positioned him as a key figure in advancing memory systems.

Collaborations

He has collaborated with notable coworkers such as V Swamy Irrinki and Farzin Karimi, contributing to a dynamic team focused on innovation in semiconductor technologies.

Conclusion

Thompson W Crosby's contributions to semiconductor memory testing through his patents demonstrate his commitment to innovation in the field. His work continues to influence advancements in memory technology, showcasing the importance of inventors in driving progress.