Thomas Yun Fook Liew

Title: Thomas Yun Fook Liew: Innovator in Magnetic Media Testing

Introduction

Thomas Yun Fook Liew is a notable inventor based in Singapore, SG. He has made significant contributions to the field of magnetic media testing, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of testing methods for magnetic thin films.

Latest Patents

Liew's latest patents include a "Method and apparatus for high throughput media defect testing using true reference value." This invention provides an efficient way to test magnetic media by utilizing an approximation for an average signal level to determine a test threshold. The method involves reading data while testing against this approximate average read signal level, allowing for adjustments based on the real average read signal.

Another significant patent is "Defect analysis in magnetic thin films." This method involves applying a magnetic field to a magnetic thin film and measuring its magnetization over various field strengths. A magnetic hardness coefficient is calculated from these measurements and compared to a reference value to determine defect information. This information can relate to the levels, types, and distribution of defects within the magnetic thin film.

Career Highlights

Thomas Yun Fook Liew is currently associated with the Data Storage Institute, where he continues to innovate in the field of magnetic media. His work has been instrumental in advancing the understanding and testing of magnetic materials.

Collaborations

Liew has collaborated with notable colleagues such as Seng Ghee Tan and Teck Ee Loh, contributing to various projects and research initiatives within the Data Storage Institute.

Conclusion

Thomas Yun Fook Liew is a prominent figure in the realm of magnetic media testing, with a focus on developing innovative methods for defect analysis. His contributions have significantly impacted the field, showcasing the importance of research and development in technology.