The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Aug. 20, 1999
Data Storage Institute, Singapore, SG;
Abstract
A method of analyzing defects in a magnetic thin film is provided. A magnetic field is applied to the magnetic thin film. The magnetization of the magnetic thin film is measured over a range of different field strengths. A value representative of a magnetic hardness coefficient is calculated for the magnetic thin film from the magnetizations measured. The calculated value is compared with a reference value. Defect information is determined in dependence upon the comparison made. The defect information determined may relate to: (a) the relative levels of defects, if the reference value is representative of the magnetic hardness coefficient of a control specimen having a predetermined defect level; (b) the predominant type of defects, if the reference value is representative of the magnetic hardness coefficient obtained when the magnetic field is applied in a different direction; and (c) the distribution of defects, if the magnetizations are measured for a selected part of the magnetic thin film and compared with a reference value which is representative of a magnetic hardness coefficient calculated from magnetizations measured for a part other than the selected part of the magnetic thin film.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile