The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Feb. 25, 2000
Applicant:
Inventors:
Seng Ghee Tan, Singapore, SG;
Thomas Yun Fook Liew, Singapore, SG;
Teck Ee Loh, Singapore, SG;
Udaya Ahangama W. Silva, Singapore, SG;
Assignee:
Data Storage Institute, Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/312 ;
U.S. Cl.
CPC ...
G01R 3/312 ;
Abstract
A method and apparatus are provided for efficiently testing magnetic media in which a read level test is performed using an approximation for an average signal level in determining a test threshold and while reading data and testing against the approximate average read signal level, the data signal level is averaged to determine the real average read signal and this value is then used to adjust the results of the comparisons performed against the approximate average read level.