Thomas Iffland

Title: The Innovations of Thomas Iffland

Introduction

Thomas Iffland is a notable inventor based in Jena, Germany. He has made significant contributions to the field of optical measurement systems, holding two patents that showcase his innovative approach to technology. His work has implications in various industries, particularly in precision measurement and imaging.

Latest Patents

Iffland's latest patents include a "Method for wavelength calibration of an optical measurement system" and a "Method for automatic focusing an imaging optical system on the surface of a sample." The first patent describes a calibration process for a spectrophotometer and an ellipsometer, ensuring that both devices are accurately matched to determine the layer thickness of a specimen. The second patent outlines a method for automatically focusing an imaging optical system by analyzing reflected light from a sample, allowing for precise adjustments based on intensity values.

Career Highlights

Throughout his career, Thomas Iffland has worked with prominent companies such as Leica Microsystems Jena GmbH and Leica Microsystems CMS GmbH. His experience in these organizations has allowed him to develop and refine his innovative techniques in optical measurement.

Collaborations

Iffland has collaborated with notable colleagues, including Gert Weniger and Joachim Wienecke. These partnerships have contributed to the advancement of his research and the successful development of his patents.

Conclusion

Thomas Iffland's contributions to optical measurement technology through his patents reflect his dedication to innovation and precision. His work continues to influence the field and inspire future advancements in measurement systems.