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For the Inventor, By the Inventor

Livermore, CA, United States of America

Thomas H Dozier, Ii

USPTO Granted Patents = 13

Average Co-Inventor Count = 5.6

ph-index = 11

Forward Citations = 884(Granted Patents)


Company Filing History:

goldMedal13 out of 506 
 
Formfactor, Inc.
 patents

Years Active: 1998-2013

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13 patents (USPTO):Explore Patents
1. 8513969 - Apparatus and method of testing singulated dies (2013-08-20),
2. 7733106 - Apparatus and method of testing singulated dies (2010-06-08),
3. 7714598 - Contact carriers (tiles) for populating larger substrates with spring contacts (2010-05-11),
4. 7347702 - Contact carriers (tiles) for populating larger substrates with spring contacts (2008-03-25),
5. 7140883 - Contact carriers (tiles) for populating larger substrates with spring contacts (2006-11-28),
6. 7059047 - Sockets for 'springed' semiconductor devices (2006-06-13),
7. 6913468 - Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods (2005-07-05),
8. 6642625 - Sockets for “springed” semiconductor devices (2003-11-04),
9. 6534856 - Sockets for “springed” semiconductor devices (2003-03-18),
10. 6232149 - Sockets for “springed” semiconductor devices (2001-05-15),
11. 6150186 - Method of making a product with improved material properties by moderate (2000-11-21),
12. 6033935 - Sockets for 'springed' semiconductor devices (2000-03-07),
13. 5806181 - Contact carriers (tiles) for populating larger substrates with spring (1998-09-15),

Title: Unveiling the Innovation of Thomas H. Dozier, II in Testing Singulated Dies

Introduction: Thomas H. Dozier, II, a brilliant inventor based in Livermore, CA (US), has made significant contributions to the field of testing singulated dies. With an impressive portfolio of 13 patents, his work at Formfactor, Inc. has been pivotal in advancing testing methods for this crucial aspect of semiconductor manufacturing.

Latest Patents: Among his latest patents is an apparatus and method for testing singulated dies. This innovative die carrier allows the testing of multiple dies in a patterned arrangement, providing a versatile solution for interfacing with different testers. Additionally, the carrier doubles as a practical shipping container, showcasing Thomas's ingenuity in optimizing processes within the industry.

Career Highlights: Throughout his career, Thomas H. Dozier, II has demonstrated a relentless pursuit of innovation. His 13 patents attest to his technical prowess and dedication to pushing the boundaries of testing technologies. His work not only enhances efficiency in die testing but also underscores his commitment to excellence in engineering.

Collaborations: Collaborating with esteemed colleagues such as Igor Y. Khandros and Gaetan L. Mathieu at Formfactor, Inc., Thomas has been part of a dynamic team driving advancements in semiconductor testing. Together, they have synergized their expertise to deliver cutting-edge solutions that redefine industry standards.

Conclusion: Thomas H. Dozier, II stands as a beacon of innovation in the realm of testing singulated dies, with his patents exemplifying a blend of technical expertise and forward-thinking creativity. His contributions to Formfactor, Inc. and the wider semiconductor industry underscore his impact as a trailblazer in optimizing testing processes.

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