Company Filing History:

14 out of 164,108

International Business Machines Corporation

Years Active: 2016-2025

where 'Filed Patents' based on already Granted Patents

15 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 12292472 - Testing a single chip in a wafer probing system (2025-05-06),

2. 11808808 - Testing a single chip in a wafer probing system (2023-11-07),

3. 11574695 - Logic built-in self-test of an electronic circuit (2023-02-07),

4. 11239152 - Integrated circuit with optical tunnel (2022-02-01),

5. 11074147 - Continuous mutual extended processor self-test (2021-07-27),

6. 10768232 - ATE compatible high-efficient functional test (2020-09-08),

7. 10746790 - Constrained pseudorandom test pattern for in-system logic built-in self-test (2020-08-18),

8. 10684930 - Functional testing of high-speed serial links (2020-06-16),

9. 10288684 - On-chip hardware-controlled window strobing (2019-05-14),

10. 10281527 - On-chip hardware-controlled window strobing (2019-05-07),

11. 10114914 - Layout effect characterization for integrated circuits (2018-10-30),

12. 9904748 - Layout effect characterization for integrated circuits (2018-02-27),

13. 9740813 - Layout effect characterization for integrated circuits (2017-08-22),

14. 9354275 - Testing an integrated circuit (2016-05-31),

15. 9319030 - Integrated circuit failure prediction using clock duty cycle recording and analysis (2016-04-19),

Title: **The Innovative Journey of Inventor Thomas Gentner**

Introduction

Thomas Gentner, an accomplished inventor based in Böblingen, Germany, has made significant contributions to the field of technology with a remarkable portfolio of 15 patents. His work primarily focuses on enhancing testing methods in wafer probing systems, showcasing his expertise and dedication to innovation in the semiconductor industry.

Latest Patents

Among his latest inventions, Gentner has developed a method for testing a single chip in a wafer probing system. This innovative approach includes several key steps: Providing an adapter plate with an interface surface that contacts a vacuum chuck in the wafer probing system, configuring the adapter plate to fit a single chip within a cutout that allows the chip's rear surface to be flush with the interface surface, and loading the adapter plate into the system. Additionally, this method determines the precise position of the chip in the adapter plate and conducts testing using predefined routines stored in the system's controller. His patents also encompass the design of a device and adapter plate specifically tailored for this testing process.

Career Highlights

Throughout his career, Thomas Gentner has worked with leading companies in the semiconductor industry, including IBM and GlobalFoundries Inc. His experiences at these prestigious organizations have contributed to his technical knowledge and innovation skills, allowing him to excel in his field.

Collaborations

Gentner has collaborated with notable professionals in his industry, including Otto Andreas Torreiter and Jens Kuenzer. These collaborations have further enriched his inventive work, enabling him to bring his patented concepts to fruition and enhance the technologies associated with wafer probing.

Conclusion

Thomas Gentner's contributions to the field of semiconductor testing through his innovative patents highlight his role as a leading inventor in technological advances. With a robust portfolio and a commitment to improving testing methods, Gentner continues to shape the future of wafer probing systems and inspire fellow inventors in the industry.

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