The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Nov. 30, 2017
International Business Machines Corporation, Armonk, NY (US);
Martin Eckert, Moetzingen, DE;
Thomas Gentner, Boeblingen, DE;
Marta Junginger, Altdorf, DE;
Eckhard Kunigkeit, Stuttgart, DE;
Matthias Pflanz, Holzgerlingen, DE;
Quintino Lorenzo Trianni, Boeblingen, DE;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A functional testing high-speed serial link system includes a testing controller that generates a functional testing program, and a device under test (DUT) that receives the functional testing program. The DUT includes a first logic circuit array that generates first results in response to executing the functional test program. The system also includes a supporting chip that receives the functional testing program. The supporting chip includes a second logic circuit array that generates second results in response to executing the functional test program. A physical data link establishes signal communication between the DUT and the supporting chip. The testing controller diagnoses the physical link based on a comparison between expected diagnostic results associated with the functional testing program, and at least one of the first results and the second results.