The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Jul. 14, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Thomas Gentner, Boeblingen, DE;

Jens Kuenzer, Boeblingen, DE;

Cedric Lichtenau, Stuttgart, DE;

Martin Padeffke, Hemmingen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G06F 11/22 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31917 (2013.01); G01R 31/3181 (2013.01); G01R 31/31905 (2013.01); G01R 31/31908 (2013.01); G01R 31/31919 (2013.01); G06F 11/2236 (2013.01);
Abstract

A method, computer program product and/or system is disclosed. According to an aspect of this invention, a device under test (DUT) is switched to a functional test mode. In some embodiments of the present invention, the DUT receives a general scan design (GSD) pattern while in the functional test mode. In some embodiments, the DUT executes a first functional test corresponding to the GSD pattern. In yet other embodiments, the DUT further comprises a state machine that controls the execution of the first functional test. The DUT may further store the output address, the output data, and the status to an address register, a data register, and a status register, respectively and/or send the output address, the output data, and the status to an address register to an automatic testing equipment (ATE).


Find Patent Forward Citations

Loading…