Company Filing History:
Years Active: 2006-2018
Title: Thierry Parrassin: Innovator in Optical Probing and Defect Detection
Introduction
Thierry Parrassin is a notable inventor based in Grenoble, France. He has made significant contributions to the field of optical probing and defect detection in electronic integrated circuits. With a total of 3 patents to his name, Parrassin's work has advanced the capabilities of identifying and classifying faulty devices.
Latest Patents
One of Parrassin's latest patents is titled "Spectral mapping of photo emission." This invention discloses an apparatus and method for optical probing of a device under test (DUT). The system enables the identification, localization, and classification of faulty devices within the DUT. A selected area of the DUT is imaged while it receives test signals, which may be static or dynamic. Light from the DUT is collected and passed through a transparent diffracting grating before being imaged by a sensor and converted into an electrical signal. The resulting image includes both the zero order and first order diffraction of the grating, with the grating configured such that the zero order aligns with emission sites imaged when the grating is outside the optical path.
Another significant patent is "Defect detection by thermal frequency imaging." This method is used for detecting defects in an electronic integrated circuit that includes a power input and a data input. The electronic integrated circuit is powered with a periodic power signal, and an input signal is applied to the data input. A surface of the electronic integrated circuit is swept with a laser beam, generating a first image from the reflected surface and a second image from a selected part of the reflected laser beam. The selected part corresponds to the frequency of the power signal, allowing defects in the integrated circuit to be detected by superposing the first and second images.
Career Highlights
Throughout his career, Parrassin has worked with prominent companies such as STMicroelectronics and FEI EFA, Inc. His experience in these organizations has contributed to his expertise in the field of electronic circuits and optical probing technologies.
Collaborations
Parrassin has collaborated with notable colleagues, including Guillaume Celi and Sylvain Dudit. These partnerships have likely enriched his work and led to innovative solutions in the industry.
Conclusion
Thierry Parrassin is a distinguished inventor whose work in optical probing and defect detection has made a significant impact in the field of