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For the Inventor, By the Inventor

North Andover, MA, United States of America

Tetsuo Ohara

This inventor holds 2 USPTO granted patents. Top assignee: Nanowave, Inc.. Active years: 2003-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuo Ohara. Retrieved from https://idiyas.com/inventor/tetsuo-ohara-t6dnpsog

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2

% Patents Active = 50.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 73(Granted Patents)


Location History:

  • Billerica, MA (US) (2003)
  • North Andover, MA (US) (2016)

Company Filing History:

goldMedal2 out of 4 
 
Nanowave, Inc.
 patents

Years Active: 2003-2016

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2 patents (USPTO):Explore Patents
1. 9464882 - Interferometer with continuously varying path length measured in wavelengths to the reference mirror (2016-10-11),
2. 6639686 - METHOD OF AND APPARATUS FOR REAL-TIME CONTINUAL NANOMETER SCALE POSITION MEASUREMENT BY BEAM PROBING AS BY LASER BEAMS AND THE LIKE OF ATOMIC AND OTHER UNDULATING SURFACES SUCH AS GRATINGS OR THE LIKE RELATIVELY MOVING WITH RESPECT TO THE PROBING BEAMS (2003-10-28),

Title: Tetsuo Ohara: Innovator in Precision Measurement Technologies

Introduction

Tetsuo Ohara is a notable inventor based in North Andover, MA (US). He has made significant contributions to the field of precision measurement technologies, holding 2 patents that showcase his innovative approach to solving complex measurement challenges.

Latest Patents

Ohara's latest patents include an "Interferometer with continuously varying path length measured in wavelengths to the reference mirror." This invention features an interferometer where the path length of the reference beam changes continuously in a sinusoidal manner. The interference signal generated by combining the measurement beam and the reference beam is processed in real-time to determine the physical distance between the measured surface and a spatial reference frame, such as a beam splitter. The processing involves analyzing the Fourier series of the intensity signal at one or more optical detectors in real-time, allowing for the extraction of phase information independently at each pixel position.

Another significant patent is the "Method of and apparatus for real-time continual nanometer scale position measurement by beam probing as by laser beams and the like of atomic and other undulating surfaces." This invention provides an improved method and apparatus for real-time continual nanometer scale position measurement using beam probing techniques. It enhances detection speeds and positioning sensing response while allowing for multi-dimensional position measurement with focused beam probes.

Career Highlights

Tetsuo Ohara is currently associated with Nanowave, Inc., where he continues to develop innovative solutions in the field of precision measurement. His work has been instrumental in advancing technologies that require high accuracy and reliability.

Conclusion

Tetsuo Ohara's contributions to precision measurement technologies through his patents reflect his dedication to innovation and excellence in engineering. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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