This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Kla Corporation. Active years: 2025.
Company Filing History:
Years Active: 2025
Title: Innovations by Inventor Teng Gu
Introduction
Teng Gu is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of metrology, particularly in the inspection of nanosheet surface roughness and profile. His work is essential for advancing technologies that require precise measurements at the nanoscale.
Latest Patents
Teng Gu holds a patent for a system titled "Metrology of nanosheet surface roughness and profile." This innovative inspection system includes a controller with a memory that maintains program instructions and one or more processors configured to execute these instructions. The program enables the generation of a geometric model of a sample's structure, the creation of an optical response function model based on this geometric model, and the extraction of parameters from measured data received from a detector.
Career Highlights
Teng Gu is currently employed at Kla Corporation, where he applies his expertise in metrology to develop advanced inspection systems. His work is pivotal in ensuring the accuracy and reliability of measurements in various applications.
Collaborations
Teng collaborates with talented coworkers, including Houssam Chouaib and HaoMiao Chang. Their combined efforts contribute to the innovative projects at Kla Corporation.
Conclusion
Teng Gu's contributions to the field of metrology through his patent and work at Kla Corporation highlight his role as an influential inventor. His innovations are paving the way for advancements in nanoscale measurement technologies.