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For the Inventor, By the Inventor

Kanagawa, Japan

Takuya Kouno

USPTO Granted Patents = 6

Average Co-Inventor Count = 2.8

ph-index = 3

Forward Citations = 36(Granted Patents)


Location History:

  • Yokkaichi, JP (2000 - 2002)
  • Mie-ken, JP (2003)
  • Yokohama, JP (2006)
  • Kanagawa, JP (2007 - 2009)

Company Filing History:

goldMedal6 out of 52,711 
 
Kabushiki Kaisha Toshiba
 patents

Years Active: 2000-2009

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6 patents (USPTO):Explore Patents
1. 7546178 - Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor device (2009-06-09),
2. 7269470 - Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor device (2007-09-11),
3. 7100146 - Design system of alignment marks for semiconductor manufacture (2006-08-29),
4. 6558852 - Exposure method, reticle, and method of manufacturing semiconductor device (2003-05-06),
5. 6437858 - Aberration measuring method, aberration measuring system and aberration measuring mask (2002-08-20),
6. 6163376 - Alignment apparatus, aberration measuring method and aberration (2000-12-19),

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