Kanagawa, Japan

Taku Amada

This inventor holds 30 USPTO granted patents and 2 published patent applications, primarily in Optical Scanning Technology. Top assignee: Ricoh Company, Ltd.. Active years: 1999-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taku Amada. Retrieved from https://idiyas.com/inventor/taku-amada

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 30 

% Patents Active = 26.7

Average Co-Inventor Count = 2.3

ph-index = 9

Forward Citations = 311(Granted Patents)


Location History:

  • Yokohama, JP (2004 - 2008)
  • Kanagawa, JP (1999 - 2015)
  • Yamato, JP (2010 - 2016)

Company Filing History:


Years Active: 1999-2016

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Areas of Expertise:
Optical Scanning Device
Image Forming Apparatus
Light Source Unit
Multi-Beam Scanning
Phase Modulation
Liquid Crystal Element
Scan-Line Control
Flow Guide
Optical Element Adjustment
Holding Mechanism
Illuminant Apparatus
Beam Positioning
30 patents (USPTO):Explore Patents

Title: Taku Amada: Pioneering Inventor from Kanagawa, JP

Introduction: Taku Amada is a renowned inventor hailing from Kanagawa, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Taku Amada holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his innovative spirit and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Taku Amada has worked with leading research institutions and tech companies, spearheading projects that have revolutionized the industry.

Collaborations: Throughout his career, Taku Amada has collaborated with top engineers, scientists, and inventors globally, fostering a culture of innovation and knowledge exchange.

Conclusion: Taku Amada's relentless pursuit of innovation and his passion for pushing the boundaries of technology make him a true visionary in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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