The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Mar. 13, 2014
Atsushi Takaura, Machida, JP;
Koji Masuda, Yokohama, JP;
Yasuhiro Nihei, Yokohama, JP;
Takeshi Ueda, Minato-ku, JP;
Koichi Kudo, Yokohama, JP;
Taku Amada, Yamato, JP;
Kenichi Shimizu, Atsugi, JP;
Asato Tamura, Kawasaki, JP;
Atsushi Takaura, Machida, JP;
Koji Masuda, Yokohama, JP;
Yasuhiro Nihei, Yokohama, JP;
Takeshi Ueda, Minato-ku, JP;
Koichi Kudo, Yokohama, JP;
Taku Amada, Yamato, JP;
Kenichi Shimizu, Atsugi, JP;
Asato Tamura, Kawasaki, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An objective is to achieve a positional change measurement device which measures positional change of a dynamic measured surface by using speckle patterns while easily reducing influence of fluctuations in a measurement environment temperature. Provided is a positional change measurement device including: a light source; an illuminating optical system configured to guide light from the light source to a measured surface; an imaging optical system; an image pickup device configured to acquire a speckle pattern by receiving reflection light from the measured surface via the imaging optical system; and detected-length compensation means for compensating for fluctuations in a detected length caused by temperature fluctuations. Positional change of the measured surface is measured based on a result of cross-correlation computation performed on multiple speckle patterns acquired at predetermined time intervals.