The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2011
Filed:
May. 24, 2007
Mitsuo Suzuki, Kanagawa, JP;
Naoki Miyatake, Kanagawa, JP;
Taku Amada, Kanagawa, JP;
Seizo Suzuki, Kanagawa, JP;
Kazuyuki Shimada, Tokyo, JP;
Satoru Itoh, Kanagawa, JP;
Mitsuo Suzuki, Kanagawa, JP;
Naoki Miyatake, Kanagawa, JP;
Taku Amada, Kanagawa, JP;
Seizo Suzuki, Kanagawa, JP;
Kazuyuki Shimada, Tokyo, JP;
Satoru Itoh, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An optical scanning characteristic control method is applied to an optical scanning system in which a beam is deflected, and the deflected beam is converged and directed toward a scanning surface, so that optical scanning of the scanning surface is performed by an optical spot formed thereon by the deflected beam. The method comprising the steps of a) disposing a beam deflection control device on the light path of the beam before it is incident on the scanning surface; and b) controlling a beam deflection amount of the beam deflecting device provide to an incident beam so as to control a scanning characteristic of the optical scanning.