Neyagawa, Japan

Takashi Kaimi



Average Co-Inventor Count = 4.3

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Mie, JP (2016)
  • Neyagawa, JP (2021)

Company Filing History:


Years Active: 2016-2021

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3 patents (USPTO):Explore Patents

Title: Inventor Spotlight: Takashi Kaimi from Neyagawa, Japan

Introduction

Takashi Kaimi is an innovative inventor based in Neyagawa, Japan, known for his contributions to the evaluation of radiated noise in semiconductor devices. With a total of three patents to his name, Kaimi has significantly impacted the field of semiconductor evaluation technology.

Latest Patents

His latest patents focus on methods and apparatuses that allow for convenient evaluation of the radiated noise generated by semiconductor devices. One of the patents details an evaluation method that includes a semiconductor device connected parallel to a load through a load cable, performing a switching operation. This method involves measuring common-mode current during the operation and outputting a benchmark for radiated noise based on the measured current.

Additionally, Kaimi's other patent introduces an estimation method for the radiated noise of semiconductor devices. This method includes measuring the voltage variation between main terminals of the semiconductor device while it undergoes a switching operation. The output involves calculating the voltage variation across frequency components, which serves as a benchmark for assessing radiated noise in semiconductor devices.

Career Highlights

Throughout his career, Takashi Kaimi has worked with prominent companies, including Fuji Electric Co., Ltd. and Fuji Electric FA Components & Systems Co., Ltd. His experiences in these organizations have contributed to his expertise and innovation in the field of semiconductor technology.

Collaborations

Kaimi collaborates with skilled professionals in the industry. Notable coworkers like Miwako Fujita and Hiroki Katsumata have worked alongside him, enhancing the shared knowledge and experience that informs his inventive processes.

Conclusion

Takashi Kaimi's work stands at the forefront of innovation in semiconductor device evaluation. His patents reflect a commitment to enhancing technology's effectiveness in measuring radiated noise, which is crucial for advancing the performance of semiconductor devices in diverse applications. As he continues to develop new methods and tools, Kaimi's impact on the industry is sure to grow, inspiring future innovations.

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