The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2021
Filed:
Jan. 29, 2019
Fuji Electric Co., Ltd., Kanagawa, JP;
Hiroki Katsumata, Hino, JP;
Michio Tamate, Hachioji, JP;
Miwako Fujita, Tachikawa, JP;
Tamiko Asano, Hino, JP;
Yuhei Suzuki, Suzuka, JP;
Takashi Kaimi, Neyagawa, JP;
Yuta Sunasaka, Fukuoka, JP;
Tadanori Yamada, Matsumoto, JP;
Ryu Araki, Matsumoto, JP;
Bao Cong Hiu, Kokubunji, JP;
FUJI ELECTRIC CO., LTD., Kanagawa, JP;
Abstract
The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.