This inventor holds 11 USPTO granted patents and 5 EPO patents. Top assignees: Ishida Co. Limited, Job Corporation, Ishida Scales Manufacturing Company, Ltd.. Active years: 1989-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Shiga, JP (1989 - 2013)
- Ritto, JP (2009 - 2020)
Company Filing History:


Years Active: 1989-2020
Title: The Innovative Contributions of Takashi Kabumoto
Introduction
Takashi Kabumoto is a prominent inventor based in Ritto, Japan. He has made significant contributions to the field of X-ray technology, holding a total of 11 patents. His work has advanced the capabilities of X-ray inspection devices, enhancing their reliability and efficiency.
Latest Patents
Among his latest patents is an X-ray inspection device that features an X-ray source, an X-ray detection unit, and an uninterruptible power supply. This innovative apparatus is designed to ensure continuous operation during power failures, as the power supply is not electrically connected to the X-ray source. Another notable patent is for an X-ray apparatus and a method of controlling it, which allows for the detection of filament breakage. This method involves monitoring the filament current and tube current, detecting changes, and issuing warnings based on the findings.
Career Highlights
Throughout his career, Takashi Kabumoto has worked with notable companies such as Ishida Co. Limited and Job Corporation. His experience in these organizations has contributed to his expertise in developing advanced X-ray technologies.
Collaborations
Takashi has collaborated with talented individuals in his field, including Atsushi Iwai and Osamu Hirose. Their teamwork has fostered innovation and led to the successful development of various technologies.
Conclusion
Takashi Kabumoto's contributions to X-ray technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in inspection devices, ensuring safety and reliability in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile