The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2009
Filed:
Aug. 08, 2008
Takashi Kabumoto, Shiga, JP;
Takashi Kabumoto, Shiga, JP;
Ishida Co., Ltd., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes an irradiation unit, a light receiving unit, a transport unit, an X-ray shield unit, and a control unit. The irradiation unit is configured to irradiate the product with X-rays. The light receiving unit is configured to detect the X-rays irradiated from the irradiation unit. The transport unit is disposed between the irradiation unit and the light receiving unit, and is configured to transport the product. The X-ray shield unit is integral with the transport unit and is formed in an area irradiated by the X-rays. The control unit is configured to detect the position at which the X-rays are blocked by the X-ray shield unit based on the amount of X-rays detected at an end portion of the light receiving unit, and to determine whether the transport unit is properly mounted based on the position.