The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Jul. 12, 2007
Takashi Kabumoto, Shiga, JP;
Atsushi Iwai, Shiga, JP;
Takashi Kabumoto, Shiga, JP;
Atsushi Iwai, Shiga, JP;
Ishida Co., Ltd., Kyoto, JP;
Abstract
An X-ray inspection apparatus detects, by an X-ray line sensor, X-rays irradiated towards a product placed on a conveyor and transmitted therethrough in order to detect the presence of foreign matter contained in the product. The X-ray inspection apparatus includes a determination unit and a calibrating unit. The determination unit is configured to determine, based on detection results by a line sensor obtained at each of prescribed positions of the conveyor, whether each of the prescribed positions of the conveyor is an appropriate position for calibrating the line sensor. The calibrating unit is configured to calibrate the line sensor based on detection results obtained by the line sensor at a position that is determined by the determination unit to be the appropriate position for calibrating the line sensor.