Ritto, Japan

Atsushi Iwai


 

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 24(Granted Patents)


Location History:

  • Shiga, JP (2011)
  • Ritto, JP (2018 - 2020)

Company Filing History:


Years Active: 2011-2020

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4 patents (USPTO):Explore Patents

Title: Atsushi Iwai: Innovator in X-ray Inspection Technology

Introduction

Atsushi Iwai is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of X-ray inspection technology, holding a total of 4 patents. His innovative designs have advanced the capabilities of X-ray inspection devices, making them more efficient and reliable.

Latest Patents

Iwai's latest patents include an X-ray inspection device and an X-ray examination device. The X-ray inspection apparatus features an X-ray source that radiates X-rays to a product, along with an X-ray detection unit that detects X-rays penetrating the product. Notably, it includes an uninterruptible power supply that provides electric power during an electric power failure, which is not electrically connected to the X-ray source. The X-ray examination device incorporates a conveyance unit, an X-ray radiation unit, an X-ray detection unit, and an image processing unit. The detection unit consists of multiple direct conversion-type X-ray detection element arrays arranged side-by-side in rows, enhancing the efficiency of the inspection process.

Career Highlights

Throughout his career, Atsushi Iwai has worked with prominent companies such as Ishida Co. Limited and Job Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the development of cutting-edge technologies in the field of X-ray inspection.

Collaborations

Iwai has collaborated with talented individuals in his field, including Takashi Kabumoto and Keiichiro Yamamoto. These partnerships have fostered innovation and have been instrumental in the successful development of his patented technologies.

Conclusion

Atsushi Iwai's contributions to X-ray inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the technical challenges in the field and a dedication to improving inspection processes.

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