IDiyas

For the Inventor, By the Inventor

Kudamatsu, Japan

Takashi Fujii

USPTO Granted Patents = 36



Average Co-Inventor Count = 3.9

ph-index = 11

Forward Citations = 417(Granted Patents)


Location History:

  • Musashino, JP (1982)
  • Hino, JP (1984 - 1986)
  • Saitama-ken, JP (2003)
  • Coppell, TX (US) (2004 - 2008)
  • Saitama, JP (2003 - 2013)
  • Kudamatsu, JP (1986 - 2015)

Company Filing History:

goldMedal22 out of 42,485 
 
Hitachi, Ltd.
 patents
silverMedal6 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
bronzeMedal4 out of 50 
 
Nisshin Seifun Group Inc.
 patents
4. 4 out of 22 
 
Nisshin Engineering Inc.
 patents
5. 2 out of 8,186 
 
Olympus Corporation
 patents
6. 1 out of 1 
 
Hitachi Sanki Eng Co., Ltd.
 patent
7. 1 out of 134 
 
Opnext Japan, Inc.
 patents
8. 3 out of 832,680 
Other
 patents
where one patent can have more than one assignee

Years Active: 1982-2015

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36 patents (USPTO):Explore Patents
1. 8926790 - Plasma processing apparatus (2015-01-06),
2. 8747608 - Plasma processing apparatus (2014-06-10),
3. 8491696 - Ultrafine alloy particles, and process for producing the same (2013-07-23),
4. 8088247 - Plasma processing apparatus (2012-01-03),
5. 7981190 - Ultrafine alloy particles, and process for producing the same (2011-07-19),
6. 7828999 - Process and apparatus for producing fine particles (2010-11-09),
7. 7649564 - Image pickup apparatus with brightness distribution chart display capability (2010-01-19),
8. 7582135 - Process for producing ultrafine particles (2009-09-01),
9. 7455790 - Emission spectroscopic processing apparatus and plasma processing method using it (2008-11-25),
10. 7411684 - Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method (2008-08-12),
11. 7303998 - Plasma processing method (2007-12-04),
12. 7271838 - Image pickup apparatus with brightness distribution chart display capability (2007-09-18),
13. 7230720 - Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method (2007-06-12),
14. 7126697 - Method and apparatus for determining endpoint of semiconductor element fabricating process (2006-10-24),
15. 7009715 - Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed (2006-03-07),

Title: The Innovative Journey of Takashi Fujii

Introduction: Takashi Fujii, a pioneering inventor hailing from Kudamatsu, Japan, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Fujii's latest patents include advancements in robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Fujii has established himself as a leading figure in the tech industry, with multiple successful ventures and patents to his name. His ability to blend creativity with technical expertise has led to the development of cutting-edge technologies that have revolutionized various sectors.

Collaborations: Throughout his career, Fujii has collaborated with top research institutions, universities, and tech companies to bring his ideas to life. His collaborative spirit and open-minded approach have allowed him to work on diverse projects and push the boundaries of innovation.

Conclusion: Takashi Fujii's relentless pursuit of innovation and his passion for creating a better future through technology make him a true visionary in the world of inventions. His impact on the tech industry is profound, and his legacy is sure to inspire future generations of inventors.

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