Company Filing History:
Years Active: 2002-2004
Title: Takanorr Aono: Innovator in Semiconductor Inspection Technology
Introduction
Takanorr Aono is a notable inventor based in Chiyoda, Japan. He has made significant contributions to the field of semiconductor inspection technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of semiconductor device inspections.
Latest Patents
Aono's latest patents include a semiconductor-device inspecting apparatus and a method for manufacturing the same. This innovative apparatus features multiple electrical connection boards and probes designed to establish electrical connections with semiconductor devices for inspection. The design incorporates a one-end supported beam, allowing each probe to be positioned strategically for optimal contact with electrode pads. Additionally, Aono has developed a structure utilizing cantilevers formed on silicon boards, with probes offset perpendicularly to enhance inspection capabilities.
Career Highlights
Throughout his career, Takanorr Aono has worked with prominent companies such as Renesas Technology Corporation and Hitachi, Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.
Collaborations
Aono has collaborated with notable coworkers, including Masatoshi Kanamaru and Yoshishige Endo. Their collective efforts have further advanced the field of semiconductor inspection.
Conclusion
Takanorr Aono's contributions to semiconductor inspection technology demonstrate his innovative spirit and commitment to advancing the industry. His patents reflect a deep understanding of the complexities involved in semiconductor device inspections, making him a key figure in this field.