Tokai, Japan

Takako Fujisawa


Average Co-Inventor Count = 7.7

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2008-2011

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3 patents (USPTO):Explore Patents

Title: Innovator Spotlight: Takako Fujisawa

Introduction

Takako Fujisawa is a renowned inventor based in Tokai, Japan, recognized for her significant contributions to the field of inspection apparatus and image processing technology. With a total of three patents to her name, Fujisawa has made remarkable strides in improving the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

Fujisawa's innovative spirit is best illustrated through her latest patents. One such patent is an "Inspection apparatus for inspecting patterns of a substrate," which introduces a pattern inspection apparatus equipped with a setting unit that caters to multiple cell areas with varying comparison pitches. This technology inspects different cell areas aligned with the specific settings, enhancing the functionality of traditional inspection processes.

Another notable invention is the "Image processing unit for wafer inspection tool." This advanced apparatus enables continuous inspections through various comparison methodologies, including cell-to-cell and die-to-die comparisons. By utilizing multiple processors for parallel processing, the device efficiently manages and processes large sets of image data, significantly advancing wafer inspection technology.

Career Highlights

Takako Fujisawa is affiliated with Hitachi High-Technologies Corporation, a leading company in the semiconductor and electronics sector. Her work at the organization has paved the way for advancements in defect detection and quality assurance in manufacturing processes.

Collaborations

Throughout her career, Fujisawa has collaborated with esteemed colleagues such as Michio Nakano and Dai Fujii. Together, they contribute to the rich fabric of innovation within their field, fostering an environment of teamwork and progress.

Conclusion

As an inventor, Takako Fujisawa stands at the forefront of technological advancements in inspection apparatus and image processing. Her persistent quest for innovation and collaboration with her peers continues to shape the future of semiconductor technology, ensuring that the industry not only meets but exceeds the growing demands for efficiency and precision.

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