Kamisato, Japan

Takahiro Togashi

This inventor holds 9 USPTO granted patents. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2008-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Togashi. Retrieved from https://idiyas.com/inventor/takahiro-togashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 55.6

Average Co-Inventor Count = 3.1

ph-index = 2

Forward Citations = 21(Granted Patents)


Location History:

  • Kamisato, JP (2008 - 2012)
  • Mito, JP (2008 - 2014)

Company Filing History:


Years Active: 2008-2014

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9 patents (USPTO):Explore Patents

Title: The Innovations of Takahiro Togashi

Introduction

Takahiro Togashi is a prominent inventor based in Kamisato, Japan. He has made significant contributions to the field of particle detection and inspection technology. With a total of nine patents to his name, Togashi's work has advanced the accuracy and efficiency of inspection processes.

Latest Patents

One of his latest patents is a method for detecting particles and defects, along with the corresponding inspection equipment. This innovative method includes an illustrated-spot illumination-distribution data table that stores illumination distribution data within a specific spot. It calculates the coordinate position of a particle or defect and its diameter based on detection light intensity data. This approach allows for increased accuracy in calculating the particle diameter and the coordinate position on the surface of an object, even when the illumination distribution is not Gaussian.

Career Highlights

Takahiro Togashi is associated with Hitachi High-Technologies Corporation, where he has been instrumental in developing advanced inspection technologies. His expertise in this area has led to numerous innovations that enhance the capabilities of inspection equipment.

Collaborations

Throughout his career, Togashi has collaborated with notable colleagues, including Shigeru Matsui and Akira Hamamatsu. These collaborations have contributed to the development of cutting-edge technologies in the field.

Conclusion

Takahiro Togashi's contributions to particle detection and inspection technology have made a significant impact in his field. His innovative methods and collaboration with esteemed colleagues continue to drive advancements in inspection processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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