Yokohama, Japan

Takahiro Nakano

This inventor holds 118 USPTO granted patents and 12 published patent applications, plus 1 CIPO patent and 11 EPO patents, primarily in Production Planning (CPC class H04N5-23274). Top assignees: Hitachi, Ltd., Nissan Motor Corp., Nec Corporation. Active years: 1989-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Nakano. Retrieved from https://idiyas.com/inventor/takahiro-nakano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 118 

% Patents Active = 39.8


 

Average Co-Inventor Count = 3.0

ph-index = 15

Forward Citations = 1,082(Granted Patents)

Forward Citations (Not Self Cited) = 992(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Katsuta, JP (1989)
  • Ibaraki, JP (1994)
  • Urawa, JP (1996)
  • Kawasaki, JP (1999)
  • Yokahama, JP (2008)
  • Hitachinaka, JP (2004 - 2012)
  • Lexington, MA (US) (2015)
  • Yokohama, JP (2001 - 2016)
  • Fujisawa, JP (2012 - 2016)
  • Tokyo, JP (2013 - 2021)

Company Filing History:


Years Active: 1989-2026

Loading Chart...
Loading Chart...
Loading Chart...
Areas of Expertise:
Abnormality Detection
Production Planning
Storage Management
Facility Monitoring
Data Migration
File Management
Three-Dimensional Modeling
Communication Systems
Electric Cameras
Factory Planning
Production Line Design
Network Processing
118 patents (USPTO):Explore Patents

Title: The Innovative Mind of Takahiro Nakano: A Journey Through Patents and Inventions

Introduction: Takahiro Nakano, based in Yokohama, Japan, is a renowned inventor with an impressive portfolio of 106 patents. His contributions to the field of robotics and monitoring systems have significantly influenced technological advancements. This article explores his latest patents, career highlights, and collaborations with esteemed professionals.

Latest Patents: Among Takahiro Nakano's latest notable inventions are two groundbreaking patents: a planning device, method, and program, along with a facility condition monitoring device and method.

The planning device is designed to optimize the arrangement design of robot cells and work processes. It enables the planning device to efficiently explore arrangement graphs, outlining potential positions and orientations between a robot and a fixture. Additionally, it determines a disassembly task sequence for operations to disassemble components, ensuring an effective trajectory for the robot based on a sequence of positioning relay points.

The facility condition monitoring device is another remarkable innovation. It incorporates a model construction part that calculates the degree of abnormality in a monitoring feature group by utilizing a normal feature group extracted from the state-quantity fluctuation data of the target facility. This device can identify abnormal situations based on calculations and determine contribution rates of various features, ultimately facilitating the identification of the underlying causes of abnormalities.

Career Highlights: Throughout his career, Takahiro Nakano has worked with prestigious companies such as Hitachi, Ltd. and NEC Corporation. His experiences in these organizations have equipped him with the expertise and skills that manifest in his impressive patent portfolio.

Collaborations: Takahiro Nakano has collaborated with many talented individuals, including Hitoshi Kamei and Yoji Nakatani. These partnerships have fostered an environment of innovation, allowing for the development of advanced technologies that cater to diverse industries.

Conclusion: Takahiro Nakano stands as a prominent figure in the realm of innovation, with a rich history of inventions that span various fields. His latest patents showcase his commitment to enhancing robotic processes and monitoring systems. As he continues to explore new frontiers, Nakano's work will undoubtedly leave a lasting impact on technology and engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…