Setagaya, Japan

Tadashi Kamada

This inventor holds 1 USPTO granted patent. Top assignees: Adv Antest Corporation, Kabushiki Kaisha Toshiba. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashi Kamada. Retrieved from https://idiyas.com/inventor/tadashi-kamada-afhd6fmn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tadashi Kamada

Introduction

Tadashi Kamada is a notable inventor based in Setagaya, Japan. He has made significant contributions to the field of technology, particularly with his innovative patent related to scan test apparatuses. His work has had a lasting impact on the industry.

Latest Patents

Kamada holds a patent for a scan test apparatus. This apparatus operates a test unit according to a test pattern and outputs address information of the test pattern at which a failure occurs. It includes a memory unit that holds circuit information, where scan flip-flops are written at corresponding addresses. Additionally, a control unit outputs, alongside the address information, a scan flip-flop name from the memory unit corresponding to the address information. He has 1 patent to his name.

Career Highlights

Throughout his career, Tadashi Kamada has worked with prominent companies such as Advantest Corporation and Kabushiki Kaisha Toshiba. His experience in these organizations has allowed him to refine his skills and contribute to various technological advancements.

Collaborations

Kamada has collaborated with notable individuals in the field, including Yasuji Ohyama and Hironobu Niijima. These partnerships have further enriched his work and expanded his influence in the industry.

Conclusion

Tadashi Kamada's contributions to technology through his innovative patent and collaborations with esteemed colleagues highlight his importance as an inventor. His work continues to inspire advancements in the field of scan testing apparatuses.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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