The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 1999
Filed:
Dec. 02, 1996
Yasuji Ohyama, Nerima-ku, JP;
Hironobu Niijima, Nerima-ku, JP;
Mitsuaki Ishikawa, Kita-ku, JP;
Tadashi Kamada, Setagaya-ku, JP;
Advantest Corporation, Tokyo, JP;
Kabushiki Kaisha Toshiba, Kanagawa, JP;
Abstract
A scan test apparatus for operating a test unit according to a test pattern and outputs address information of the test pattern at which a fail takes place, which includes a memory unit for holding circuit information in which scan flip-flops are written at corresponding addresses and a control unit for outputting, in addition to the address information, a scan flip-flop name from the memory unit corresponding to the address information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile