Ohizumi-machi, Japan

Hironobu Niijima


Average Co-Inventor Count = 2.4

ph-index = 7

Forward Citations = 161(Granted Patents)


Location History:

  • Tatebayashi, JP (1988 - 1989)
  • Ohra, JP (1996)
  • Gunma, JP (1997)
  • Ohizumi-machi, JP (1997 - 1998)
  • Ohra-gun, JP (1998)
  • Nerima-ku, JP (1999)

Company Filing History:


Years Active: 1988-1999

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9 patents (USPTO):Explore Patents

Title: The Innovations of Hironobu Niijima: A Pioneer in Test Apparatus Technology

Introduction

Hironobu Niijima, hailing from Ohizumi-machi, Japan, is a distinguished inventor with a remarkable portfolio of nine patents. His contributions to the field of test apparatus technology, particularly in integrated circuit (IC) fault location tracing and scan testing, showcase his ingenuity and commitment to advancing electronic diagnostics.

Latest Patents

Niijima's latest patents reflect his innovative approach to tackling complex problems in electronic testing. One of his significant inventions is a **scan test apparatus**, designed to operate test units according to a test pattern, ultimately outputting address information at which a failure occurs. This apparatus includes a memory unit that retains circuit information and a control unit that enhances the output, facilitating more efficient testing processes.

Another noteworthy invention is the **IC fault location tracing apparatus and method**. This patent provides an intuitive means for users, regardless of their design knowledge, to identify fault locations within integrated circuits swiftly. The apparatus employs a control device that processes visual field data and captures electric potential contrast images, streamlining the fault identification process through various recognition means.

Career Highlights

Throughout his career, Hironobu Niijima has been associated with notable organizations including Advantest Corporation and Nippon Telegraph and Telephone Public Corporation. At these companies, he has contributed significantly to product development and innovation in the realm of test engineering.

Collaborations

Niijima has collaborated with esteemed colleagues, such as Hiroshi Kawamoto and Soichi Shida. Their collective expertise has undoubtedly bolstered the impactful advancements made in the field of electronic testing systems.

Conclusion

Hironobu Niijima is a pioneering figure within the realm of test apparatus technology. His inventive spirit and commitment to innovation are exemplified through his patents, which continue to influence the design and efficiency of electronic diagnostics. As technology evolves, the contributions of inventors like Niijima will play a crucial role in shaping the future of the industry.

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