Kanagawa, Japan

Susumu Iida

This inventor holds 2 USPTO granted patents. Top assignees: Kabushiki Kaisha Toshiba, Nec Corporation, Nuflare Technology, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Susumu Iida. Retrieved from https://idiyas.com/inventor/susumu-iida-tuwgcreg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2012

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2 patents (USPTO):Explore Patents

Title: Susumu Iida: Innovator in Lithography and Mask Inspection Technologies

Introduction

Susumu Iida is a notable inventor based in Kanagawa, Japan, recognized for his contributions to the fields of lithography and mask inspection technologies. With a total of two patents to his name, Iida has made significant advancements that enhance the precision and efficiency of workpiece inspections.

Latest Patents

Iida's latest patents include innovative technologies that address critical challenges in the industry. One of his patents focuses on ultrafine lithography pattern inspection using multi-stage TDI image sensors with false image removability. This workpiece inspection apparatus features a measured image generator unit that measures a pattern of a workpiece and generates a measured image. The comparator unit then compares this measured image to a fiducial image. The measured image generator unit employs an interconnection of two or more time delay integration (TDI) sensors, each arranged with multiple line sensors and pixels. This design allows for the generation of an average value of pixel values while excluding abnormal pixel values, ensuring accurate pattern measurement.

Another significant patent is a lightweight and inexpensive mask inspection apparatus that boasts highly efficient environmental radiation resistance. This apparatus is designed for inspecting mask defects and includes a light source, an illuminating optical system, and a magnifying optical system. The image sensor within the apparatus is equipped with an environmental radiation shielding member made of heavy metal, ensuring durability and reliability in various conditions.

Career Highlights

Throughout his career, Susumu Iida has worked with prominent companies such as Toshiba Corporation and NEC Corporation. His experience in these leading technology firms has allowed him to develop and refine his innovative ideas, contributing to advancements in the field.

Collaborations

Iida has collaborated with notable colleagues, including Akira Kataoka and Ikunao Isomura. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further enhancing the quality of their work.

Conclusion

Susumu Iida's contributions to lithography and mask inspection technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the industry's needs and a dedication to improving inspection processes. Iida's work continues to influence the field, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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