Suresh Selvaraj

Title: Suresh Selvaraj: Innovator in Metrology Guided Inspection

Introduction

Suresh Selvaraj is a notable inventor based in Fremont, CA. He has made significant contributions to the field of metrology guided inspection through his innovative patent. His work focuses on improving processes related to specimen analysis, which is crucial in various technological applications.

Latest Patents

Suresh holds a patent titled "Wafer signature local maxima via clustering for metrology guided inspection." This patent describes methods and systems for generating information that aids in setting up processes performed on a specimen. One of the key methods involves clustering dies on a specimen based on colors assigned to the dies, which are responsive to predicted defect densities determined from measurements. The process includes analyzing initial die clusters to identify and designate final die clusters, which are essential for effective process setup.

Career Highlights

Suresh is currently employed at Kla Corporation, where he applies his expertise in metrology and inspection technologies. His role involves collaborating with other professionals to enhance the efficiency and accuracy of inspection processes. His innovative approach has led to advancements in the field, making him a valuable asset to his company.

Collaborations

Some of Suresh's coworkers include Alan Davila and Marcus Liesching. Their collaboration fosters a creative environment that encourages the development of new ideas and solutions in the field of metrology.

Conclusion

Suresh Selvaraj's contributions to metrology guided inspection through his patent and work at Kla Corporation highlight his role as an influential inventor. His innovative methods continue to impact the industry positively.